Description
SCANNING ELECTRON MICROSCOPEConfiguration
No ConfigurationOEM Model Description
Multi Vision Metrology Scanning Electron Microscope In addition to its high-functionality CD-SEM features, the E3630 makes 3D imaging and measurement at the nanometer level, in real time and in a non-destructive way, possible. The E3630 significantly contributes to reducing TAT in R&D and production for many processes that require high-precision and/or 3D analysis.Documents
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ADVANTEST
E3630
Verified
CATEGORY
SEM
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
79946
Wafer Sizes:
Unknown
Vintage:
Unknown
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Logistics Support
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Money Back Guarantee
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Refurbishment Services
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E3630
Verified
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
79946
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SCANNING ELECTRON MICROSCOPEConfiguration
No ConfigurationOEM Model Description
Multi Vision Metrology Scanning Electron Microscope In addition to its high-functionality CD-SEM features, the E3630 makes 3D imaging and measurement at the nanometer level, in real time and in a non-destructive way, possible. The E3630 significantly contributes to reducing TAT in R&D and production for many processes that require high-precision and/or 3D analysis.Documents
No documents