Description
ANALYTICAL EQUIPMENTConfiguration
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEM Model Description
Field Emission Scanning Electron MicroscopeDocuments
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HITACHI
S-4800 II
Verified
CATEGORY
SEM
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
36384
Wafer Sizes:
8"/200mm
Vintage:
2007
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
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HITACHI
S-4800 II
Verified
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
36384
Wafer Sizes:
8"/200mm
Vintage:
2007
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
ANALYTICAL EQUIPMENTConfiguration
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEM Model Description
Field Emission Scanning Electron MicroscopeDocuments
No documents