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ZEISS / CARL ZEISS MERLIN
    Description
    Details Attached
    Configuration
    FA SEMs/TEMs/Dual Beams Specification: Secondary electron image resolution: 0.8 nm @ 15kV 1.4 nm @ 1kV 0.6 nm @ 30kV STEM Mode 3.0 nm @ 20Kv at 10nA WD = 8.5nm Magnification: 12 – 2,000,000X Specimen Stage: Stage Motorization: 5 Axis Stage Motorization X = 130mm, Y = 130mm, Z = 50mm, T = -3 to 70 deg, R = 360 deg Configuration: Operating System: Windows XP Pro BSD STEM Load Lock Motorized Stage Smart SEM Version 5.07 Oxford EDX 50mm Sq detector XEI Plasma Cleaner
    OEM Model Description
    None Provided
    Documents
    verified-listing-icon

    Verified

    CATEGORY
    SEM / FIB

    Last Verified: Yesterday

    Key Item Details

    Condition:

    Refurbished


    Operational Status:

    Unknown


    Product ID:

    148922


    Wafer Sizes:

    Unknown


    Vintage:

    2010


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ZEISS / CARL ZEISS MERLIN

    ZEISS / CARL ZEISS

    MERLIN

    SEM / FIB
    Vintage: 2011Condition: Used
    Last VerifiedOver 60 days ago

    ZEISS / CARL ZEISS

    MERLIN

    verified-listing-icon
    Verified
    CATEGORY
    SEM / FIB
    Last Verified: Yesterday
    listing-photo-b17c996080b242eaae709d397c7eb338-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85592/b17c996080b242eaae709d397c7eb338/d16a4b0320c940e5a34110bb0e6c7ccb_b63defffe28f4e6794506de835c5d16d1201a_mw.jpeg
    listing-photo-b17c996080b242eaae709d397c7eb338-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/85592/b17c996080b242eaae709d397c7eb338/1d2226dba15844e0a9dc9302f8bcb021_680c2544d77741909d41b6f7bd304bf01201a_mw.jpeg
    Key Item Details

    Condition:

    Refurbished


    Operational Status:

    Unknown


    Product ID:

    148922


    Wafer Sizes:

    Unknown


    Vintage:

    2010


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Details Attached
    Configuration
    FA SEMs/TEMs/Dual Beams Specification: Secondary electron image resolution: 0.8 nm @ 15kV 1.4 nm @ 1kV 0.6 nm @ 30kV STEM Mode 3.0 nm @ 20Kv at 10nA WD = 8.5nm Magnification: 12 – 2,000,000X Specimen Stage: Stage Motorization: 5 Axis Stage Motorization X = 130mm, Y = 130mm, Z = 50mm, T = -3 to 70 deg, R = 360 deg Configuration: Operating System: Windows XP Pro BSD STEM Load Lock Motorized Stage Smart SEM Version 5.07 Oxford EDX 50mm Sq detector XEI Plasma Cleaner
    OEM Model Description
    None Provided
    Documents
    Similar Listings
    View All
    ZEISS / CARL ZEISS MERLIN

    ZEISS / CARL ZEISS

    MERLIN

    SEM / FIBVintage: 2011Condition: UsedLast Verified:Over 60 days ago
    ZEISS / CARL ZEISS MERLIN

    ZEISS / CARL ZEISS

    MERLIN

    SEM / FIBVintage: 2010Condition: RefurbishedLast Verified:Yesterday
    ZEISS / CARL ZEISS MERLIN

    ZEISS / CARL ZEISS

    MERLIN

    SEM / FIBVintage: 2000Condition: UsedLast Verified:Over 60 days ago