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Description
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The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) ImagingOEM Model Description
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Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
117400
Wafer Sizes:
Unknown
Vintage:
Unknown
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Transaction Insured by Moov
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Refurbishment Services
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JEOL
JSM 7000F
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
117400
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) ImagingOEM Model Description
None ProvidedDocuments
No documents