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6" Fab For Sale from Moov - Click Here to Learn More
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JEOL JSM 7000F
    Description
    No description
    Configuration
    The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) Imaging
    OEM Model Description
    None Provided
    Documents

    No documents

    JEOL

    JSM 7000F

    verified-listing-icon

    Verified

    CATEGORY
    SEM / FIB

    Last Verified: Today

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    117400

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    JEOL JSM 7000F

    JEOL

    JSM 7000F

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedOver 30 days ago
    JEOL JSM 7000F

    JEOL

    JSM 7000F

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedToday
    JEOL JSM 7000F

    JEOL

    JSM 7000F

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    JEOL

    JSM 7000F

    verified-listing-icon
    Verified
    CATEGORY
    SEM / FIB
    Last Verified: Today
    listing-photo-c505d5f4dcea4dd2bf279a9a005cdeb6-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/48780/c505d5f4dcea4dd2bf279a9a005cdeb6/9ec64efe81344af9ad9c815c79e93642_jeoljsm7000finuse_mw.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    117400

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis. Schottky Field Emission Cathode High Resolution (1.2nm @30kV) Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) Imaging
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    JEOL JSM 7000F

    JEOL

    JSM 7000F

    SEM / FIBVintage: 0Condition: UsedLast Verified:Over 30 days ago
    JEOL JSM 7000F

    JEOL

    JSM 7000F

    SEM / FIBVintage: 0Condition: UsedLast Verified:Today
    JEOL JSM 7000F

    JEOL

    JSM 7000F

    SEM / FIBVintage: 0Condition: UsedLast Verified:Over 60 days ago