Description
Imaging Resolution (SEM-mode): 1.2 nm 30kv 1.5 nm 15kv 3.0 nm 1kv Magnification Range: 10X-500,000X Deben PCD Beam Blanking System Beam Current 10pA-200nA Computer controlled large eucentric specimen stage Nabity's Nanometer Pattern Generation System V9.0 Thermal FE SEM.Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents
JEOL
JSM 7000F
CATEGORY
SEM / FIB
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
134592
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Imaging Resolution (SEM-mode): 1.2 nm 30kv 1.5 nm 15kv 3.0 nm 1kv Magnification Range: 10X-500,000X Deben PCD Beam Blanking System Beam Current 10pA-200nA Computer controlled large eucentric specimen stage Nabity's Nanometer Pattern Generation System V9.0 Thermal FE SEM.Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents