Description
REVIEW SEMConfiguration
No ConfigurationOEM Model Description
Same high performance optics as S-3400N Variable Pressure mode as standard Large samples up to 153mm in diameter (observation range 126mm in diameter) Observation and EDS analysis on a sample up to 60mm tall Main unit is only 55 cm wide, operating table can be provided by user. TMP vacuum is standard Resolution: 3.0 nm（30kV,SE,HV), 4.0 nm(30kV,BSE,LV)Documents
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HITACHI
SU1510
CATEGORY
SEM / FIB
Last Verified: 6 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
148247
Wafer Sizes:
2"/50mm, 4"/100mm, 6"/150mm
Vintage:
2016
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
REVIEW SEMConfiguration
No ConfigurationOEM Model Description
Same high performance optics as S-3400N Variable Pressure mode as standard Large samples up to 153mm in diameter (observation range 126mm in diameter) Observation and EDS analysis on a sample up to 60mm tall Main unit is only 55 cm wide, operating table can be provided by user. TMP vacuum is standard Resolution: 3.0 nm（30kV,SE,HV), 4.0 nm(30kV,BSE,LV)Documents
No documents