
Description
No missing parts. With EDXConfiguration
No ConfigurationOEM Model Description
Field Emission Scanning Electron MicroscopeDocuments
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S-4800 II
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
129996
Wafer Sizes:
Unknown
Vintage:
2003
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available