Description
Stage with TMP High-resolution electron microscope Installation utility requirements: Room temperature: 15 ~ 25 °C or 59 ~ 77 °F Relative humidity: 60% or less Power: Single phase AC 100, 110, 115, 200, 220, 240V ±10%, 50/60 Hz, 4 kVA (Continuous supply is required.) Grounding: First grade grounding (Grounding resistance of 100 ohms or less) × 1 Cooling water: 1.5 ~ 2.0 l/min., 50 ~ 100 kPa 10 ~ 20°C, variation within 0.5°C/10 min.Configuration
Accessories: Chamber scope Upgraded Turbo Molecular Pump Joystick Stage Controller SPECIFICATION Secondary electron image resolution: 2.1 nm at 1 kV 1.5 nm at 15 kV Electron optics: Electron gun Cold field emission electron source Acc. voltage 0.5 ~ 30 kV (variable at 0.1 kV/step) Probe current 1 pA ~ 2 nA (depends on Acc. voltage) Magnification ×20 ×500,000 Objective aperture Heated movable aperture, 4-opening, selectable and alignable outside the vacuum Image display: Operation/display OS: Windows NT with Internal Computer for extracting files. Scan mode: Normal, Split/dual mag./line scan, position set, spot, AAF, SAA, oblique Frame memory: 640 × 480 pixels, 1,280 × 960 pixels, 2,560 × 1,920 pixels Image filing Image data base with various reference functions built-in Image file format BMP, TIFF, JPEG selectable Scan speed TV, slow (0.5 ~ 40 s/frame) for viewing Slow (40 ~ 320 s/frame) for recording Image processing Automatic image brightness & contrast, raster rotation, autofocus, auto-stigmation, averaging, frame integration, color display Auto data recording Film numbering, acc. voltage, micron bar with a scale, magnification, date, hours and working distance Electrical image shift ±15 microns (at W.D = 12 mm) Vacuum system System Automatic vacuum sequence with pneumatic valve controls Evacuation: Vacuum ~10–7 Pa (electron gun), ~10–4 Pa (specimen chamber) Pumps Fore pumps 140 l/min (168 l/min) Diffusion pump 570 l/s × 1 set, and Ion pumps × 3 sets Protection System protection against power, water and vacuum failures. Dimensions & weight: Column 82 × 88 × 165 (H) cm, 410 kg (for type II stage) Display 120 × 90 × 137(H) cm, 235 kg Ion pump power supply 37 × 60 × 60 (H) cm, 75 kg Power unit 39 × 70 × 47 (H) cm, 35 kg Optional accessories EDX system, TMP vacuum system, Closed water circulator, RS-232C comunication interface, network interface.OEM Model Description
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.Documents
No documents
Similar Listings
View All
HITACHI
S-4700 II
CATEGORY
SEM / FIB
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
146121
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Stage with TMP High-resolution electron microscope Installation utility requirements: Room temperature: 15 ~ 25 °C or 59 ~ 77 °F Relative humidity: 60% or less Power: Single phase AC 100, 110, 115, 200, 220, 240V ±10%, 50/60 Hz, 4 kVA (Continuous supply is required.) Grounding: First grade grounding (Grounding resistance of 100 ohms or less) × 1 Cooling water: 1.5 ~ 2.0 l/min., 50 ~ 100 kPa 10 ~ 20°C, variation within 0.5°C/10 min.Configuration
Accessories: Chamber scope Upgraded Turbo Molecular Pump Joystick Stage Controller SPECIFICATION Secondary electron image resolution: 2.1 nm at 1 kV 1.5 nm at 15 kV Electron optics: Electron gun Cold field emission electron source Acc. voltage 0.5 ~ 30 kV (variable at 0.1 kV/step) Probe current 1 pA ~ 2 nA (depends on Acc. voltage) Magnification ×20 ×500,000 Objective aperture Heated movable aperture, 4-opening, selectable and alignable outside the vacuum Image display: Operation/display OS: Windows NT with Internal Computer for extracting files. Scan mode: Normal, Split/dual mag./line scan, position set, spot, AAF, SAA, oblique Frame memory: 640 × 480 pixels, 1,280 × 960 pixels, 2,560 × 1,920 pixels Image filing Image data base with various reference functions built-in Image file format BMP, TIFF, JPEG selectable Scan speed TV, slow (0.5 ~ 40 s/frame) for viewing Slow (40 ~ 320 s/frame) for recording Image processing Automatic image brightness & contrast, raster rotation, autofocus, auto-stigmation, averaging, frame integration, color display Auto data recording Film numbering, acc. voltage, micron bar with a scale, magnification, date, hours and working distance Electrical image shift ±15 microns (at W.D = 12 mm) Vacuum system System Automatic vacuum sequence with pneumatic valve controls Evacuation: Vacuum ~10–7 Pa (electron gun), ~10–4 Pa (specimen chamber) Pumps Fore pumps 140 l/min (168 l/min) Diffusion pump 570 l/s × 1 set, and Ion pumps × 3 sets Protection System protection against power, water and vacuum failures. Dimensions & weight: Column 82 × 88 × 165 (H) cm, 410 kg (for type II stage) Display 120 × 90 × 137(H) cm, 235 kg Ion pump power supply 37 × 60 × 60 (H) cm, 75 kg Power unit 39 × 70 × 47 (H) cm, 35 kg Optional accessories EDX system, TMP vacuum system, Closed water circulator, RS-232C comunication interface, network interface.OEM Model Description
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.Documents
No documents