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HITACHI HD-2300
    Description
    ANALYTICAL EQUIPMENT
    Configuration
    FA SEMs/TEMs/Dual Beams 200kV dedicated STEM with thermal FE election source Resolution 0.204nm Phase contract image (TE image), Z-contrast image (ZC image), Secondary electron image (SE image)
    OEM Model Description
    200 kV dedicated STEM for semiconducting industry, materials science and biological science.
    Documents

    No documents

    HITACHI

    HD-2300

    verified-listing-icon

    Verified

    CATEGORY
    SEM / FIB

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    20309

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    HITACHI HD-2300

    HITACHI

    HD-2300

    SEM / FIB
    Vintage: 2006Condition: Used
    Last VerifiedOver 60 days ago
    HITACHI HD-2300

    HITACHI

    HD-2300

    SEM / FIB
    Vintage: 2006Condition: Used
    Last VerifiedOver 60 days ago
    HITACHI HD-2300

    HITACHI

    HD-2300

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    HITACHI

    HD-2300

    verified-listing-icon
    Verified
    CATEGORY
    SEM / FIB
    Last Verified: Over 60 days ago
    listing-photo-qBs8gv9chPWc0WMdDfhRCgzijTxjn4g-RQFCB0_iEfk-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    20309

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    ANALYTICAL EQUIPMENT
    Configuration
    FA SEMs/TEMs/Dual Beams 200kV dedicated STEM with thermal FE election source Resolution 0.204nm Phase contract image (TE image), Z-contrast image (ZC image), Secondary electron image (SE image)
    OEM Model Description
    200 kV dedicated STEM for semiconducting industry, materials science and biological science.
    Documents

    No documents

    Similar Listings
    View All
    HITACHI HD-2300

    HITACHI

    HD-2300

    SEM / FIBVintage: 2006Condition: UsedLast Verified:Over 60 days ago
    HITACHI HD-2300

    HITACHI

    HD-2300

    SEM / FIBVintage: 2006Condition: UsedLast Verified:Over 60 days ago
    HITACHI HD-2300

    HITACHI

    HD-2300

    SEM / FIBVintage: 0Condition: UsedLast Verified:Over 60 days ago