Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Helios NanoLab 1200 Full Wafer DualBeam Technology for High Resolution Imaging, Analysis and TEM Sample Preparation for 300 mm WafersDocuments
No documents
CATEGORY
SEM / FIB
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
138745
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
HELIOS NANOLAB 1200
CATEGORY
SEM / FIB
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
138745
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Helios NanoLab 1200 Full Wafer DualBeam Technology for High Resolution Imaging, Analysis and TEM Sample Preparation for 300 mm WafersDocuments
No documents