Description
No descriptionConfiguration
A. Dual beam B. TLD and CDEM Detectors C. Integrated EDS Detector D. ELSTAR UHR Electron column E. Sidewinder Ion column F. Omni probe nanomanipulator G. Plasma cleaner H. Vacuum system I. (3) IGPs J. Water-cooled turbo and dry PVP K. 5-Axis (X, Y, Z, R, Tilt), Compucentric stage, 300 mm piezo L. GIS chemistries: IEE, EE, C, Pt, W, H20, IDEP M. Gas injection system: Maximum (4) Injectors, 1 Included, Pt/W N. Operating system: Windows OSOEM Model Description
Helios NanoLab 1200 Full Wafer DualBeam Technology for High Resolution Imaging, Analysis and TEM Sample Preparation for 300 mm WafersDocuments
No documents
CATEGORY
SEM / FIB
Last Verified: 3 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
149104
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
HELIOS NANOLAB 1200
CATEGORY
SEM / FIB
Last Verified: 3 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
149104
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
A. Dual beam B. TLD and CDEM Detectors C. Integrated EDS Detector D. ELSTAR UHR Electron column E. Sidewinder Ion column F. Omni probe nanomanipulator G. Plasma cleaner H. Vacuum system I. (3) IGPs J. Water-cooled turbo and dry PVP K. 5-Axis (X, Y, Z, R, Tilt), Compucentric stage, 300 mm piezo L. GIS chemistries: IEE, EE, C, Pt, W, H20, IDEP M. Gas injection system: Maximum (4) Injectors, 1 Included, Pt/W N. Operating system: Windows OSOEM Model Description
Helios NanoLab 1200 Full Wafer DualBeam Technology for High Resolution Imaging, Analysis and TEM Sample Preparation for 300 mm WafersDocuments
No documents