Description
THERMOFISHER SCIENTIFIC / FEI / PHILIPS Nova 600i NANOLAB Dual Beam FIB/SEMConfiguration
FEI Nova 600i Dual Beam FIB-SEM System: - FEI Nova Dual Beam (FIB + SEM) - Gallium liquid metal ion source (FIB) - Field emission electron source (SEM) Software / automation: - AutoTEM — automated TEM lamella preparation - AutoFIB — automated FIB milling and serial sectioning - AutoScript — scripting environment for custom automation Gas Injection System: - 3-port GIS: Platinum (Pt) / iDep2 / Gold (Au) - Note: originally configured with IEE (XeF₂ etch), modified to Au Micromanipulation: - Omniprobe in-situ micromanipulator Analytical detectors: - EDAX EBSD system — included (not currently installed, available with tool) - EDS — not included (retained by seller)OEM Model Description
Nova 600 Nanolab DualBeam-SEM/FIB for Nanoscale Prototyping, Machining, Characterization, and Analysis of Structures below 100 nm.Documents
CATEGORY
SEM / FIB
Last Verified: 7 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
150788
Wafer Sizes:
Unknown
Vintage:
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILIPS
NOVA 600 NANOLAB
CATEGORY
SEM / FIB
Last Verified: 7 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
150788
Wafer Sizes:
Unknown
Vintage:
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available