Description
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Gallium FIB Gas injection sources: Platinum, Tungsten and SiO2 Omniprobe micromanipulator Cooling water chiller Instrument computer with all the necessary software for operating and supporting the instrument installed Comes with instruction manuals (USB memory) and assorted minor spare parts Good instrument for imaging, making sample cross sections and TEM lamellas The FIB-SEM is complete and fully functional, has been serviced and maintained by FEI technicians regularly every year since installationOEM Model Description
Nova 600 Nanolab DualBeam-SEM/FIB for Nanoscale Prototyping, Machining, Characterization, and Analysis of Structures below 100 nm.Documents
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
NOVA 600 NANOLAB
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Idle
Product ID:
97598
Wafer Sizes:
Unknown
Vintage:
2005
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
NOVA 600 NANOLAB
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Idle
Product ID:
97598
Wafer Sizes:
Unknown
Vintage:
2005
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Gallium FIB Gas injection sources: Platinum, Tungsten and SiO2 Omniprobe micromanipulator Cooling water chiller Instrument computer with all the necessary software for operating and supporting the instrument installed Comes with instruction manuals (USB memory) and assorted minor spare parts Good instrument for imaging, making sample cross sections and TEM lamellas The FIB-SEM is complete and fully functional, has been serviced and maintained by FEI technicians regularly every year since installationOEM Model Description
Nova 600 Nanolab DualBeam-SEM/FIB for Nanoscale Prototyping, Machining, Characterization, and Analysis of Structures below 100 nm.Documents
No documents