Description
Process - Sample Analysis / Measurement Main System - Main tool (1) *Excluded Items: No chiller availableConfiguration
No ConfigurationOEM Model Description
FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.Documents
No documents
CATEGORY
SEM / FIB
Last Verified: Today
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
146759
Wafer Sizes:
Unknown
Vintage:
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILIPS
STRATA 400
CATEGORY
SEM / FIB
Last Verified: Today
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
146759
Wafer Sizes:
Unknown
Vintage:
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Process - Sample Analysis / Measurement Main System - Main tool (1) *Excluded Items: No chiller availableConfiguration
No ConfigurationOEM Model Description
FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.Documents
No documents