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THERMOFISHER SCIENTIFIC / FEI / PHILIPS STRATA 400
    Description
    FIB / SEM system
    Configuration
    Known issues: Not included: Chiller Main Tool Process: Sample Analysis / Measurement
    OEM Model Description
    FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.
    Documents

    No documents

    verified-listing-icon

    Verified

    CATEGORY
    SEM / FIB

    Last Verified: 5 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    154813


    Wafer Sizes:

    Unknown


    Vintage:

    2005


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS STRATA 400

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    STRATA 400

    SEM / FIB
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    STRATA 400

    verified-listing-icon
    Verified
    CATEGORY
    SEM / FIB
    Last Verified: 5 days ago
    listing-photo-61de57e7a4cc44d2b94ea3861d323913-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    154813


    Wafer Sizes:

    Unknown


    Vintage:

    2005


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    FIB / SEM system
    Configuration
    Known issues: Not included: Chiller Main Tool Process: Sample Analysis / Measurement
    OEM Model Description
    FEI’s Strata 400 STEM is a high-resolution analytical tool designed to support the increasing need for high-resolution analytical capabilities as device geometries shrink below 100 nm and new material systems are introduced. It includes integrated sample lift-out and handling, with SEM-STEM imaging to enable high-contrast, high-resolution analysis. The innovative Flipstage™ moves the sample from milling to STEM-imaging position in seconds, without breaking vacuum, while the new Sidewinder™ ion column provides improved sample throughput and ultimate sample quality.
    Documents

    No documents

    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS STRATA 400

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    STRATA 400

    SEM / FIBVintage: 0Condition: UsedLast Verified:Over 60 days ago
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS STRATA 400

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    STRATA 400

    SEM / FIBVintage: 2005Condition: UsedLast Verified:Over 60 days ago
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS STRATA 400

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    STRATA 400

    SEM / FIBVintage: 2005Condition: UsedLast Verified:Over 60 days ago