Description
Schottky FEG SEM Works in high and low vacuum with high resolution …same imaging specs in both modes Decel mode for low KV performance 150mm stage and large chamber for flexibility Easy to add analytical capabilityConfiguration
No ConfigurationOEM Model Description
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.Documents
No documents
CATEGORY
SEM / FIB
Last Verified: 14 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
112436
Wafer Sizes:
6"/150mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILIPS
NOVA NANOSEM 600
CATEGORY
SEM / FIB
Last Verified: 14 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
112436
Wafer Sizes:
6"/150mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Schottky FEG SEM Works in high and low vacuum with high resolution …same imaging specs in both modes Decel mode for low KV performance 150mm stage and large chamber for flexibility Easy to add analytical capabilityConfiguration
No ConfigurationOEM Model Description
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.Documents
No documents