Description
Supplied Accessories-F needle 2 pieces Main functions :- The sheet resistance of a conductive thin film is tested, and the thickness is calculated based on the relationship between resistance and film thickness. Random accessories - F Probe , a set of resistor blocks (27.9kΩ/sq.) 279.4Ω/sq, 2.794Ω/ sq Software version - RS SW: 10.0.0.6Configuration
Hardware configuration - • Galil Motion Controller • I7 Computer • Dual Probe Arm: P1 / P2 • LP1: 200mm OCA+ • LP2: 200mm OCA+OEM Model Description
Sheet Resistance Measurement Systems The OmniMap® RS-200 resistivity mapping system, based on proven industry resistivity mapping standards, provides accurate and reliable sheet resistance measurement for 45nm and beyond. This resistivity mapping system provides capabilities such as advanced automation and improved edge performance to meet today's 300mm wafer production requirements.Documents
Verified
CATEGORY
Resistivity / Four Point Probe
Last Verified: Today
Key Item Details
Condition:
Used
Operational Status:
Installed / Idle
Product ID:
117828
Wafer Sizes:
8"/200mm
Vintage:
2022
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
OmniMap RS200+
CATEGORY
Resistivity / Four Point Probe
Last Verified: Today
Key Item Details
Condition:
Used
Operational Status:
Installed / Idle
Product ID:
117828
Wafer Sizes:
8"/200mm
Vintage:
2022
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available