Description
3D Laser Microscope,Configuration
No ConfigurationOEM Model Description
The Zeta-20 is the industry’s first optical profilometer to use ZDot™, a patented technique that combines structured-illumination, confocal optics to generate high-resolution, 3D surface topography data and a True Color image of the surface. This technique enables users to easily focus on any transparent or opaque surface, for fast measurements of step heights and roughness. Multi-mode optics expand the capability of the non-contact 3D surface profiler by combining ZDot with white light interferometry, shearing interferometry, a reflectometer for transparent thin-films, and automated defect inspection.Documents
No documents
KLA
Zeta-20
Verified
CATEGORY
Profiler
Last Verified: 23 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
103665
Wafer Sizes:
Unknown
Vintage:
2022
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
Zeta-20
CATEGORY
Profiler
Last Verified: 23 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
103665
Wafer Sizes:
Unknown
Vintage:
2022
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
3D Laser Microscope,Configuration
No ConfigurationOEM Model Description
The Zeta-20 is the industry’s first optical profilometer to use ZDot™, a patented technique that combines structured-illumination, confocal optics to generate high-resolution, 3D surface topography data and a True Color image of the surface. This technique enables users to easily focus on any transparent or opaque surface, for fast measurements of step heights and roughness. Multi-mode optics expand the capability of the non-contact 3D surface profiler by combining ZDot with white light interferometry, shearing interferometry, a reflectometer for transparent thin-films, and automated defect inspection.Documents
No documents