Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Tencor HRP-200 High-Resolution Profiler is a fully-automated system that provides global and local analysis of wafer surface topography. It can measure surface topography on both macroscopic and microscopic scales, combining long scans with fine-area analysis of submicron features. It allows process engineers to quickly compare feature depths and relative surface heights. It also combines the measurement repeatability and ease of use of a Tencor stylus profiler with the high-resolution analysis and imaging capabilities of an Atomic Force Microscope (AFM).Documents
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KLA
HRP-200
CATEGORY
Profiler
Last Verified: 5 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
154851
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Tencor HRP-200 High-Resolution Profiler is a fully-automated system that provides global and local analysis of wafer surface topography. It can measure surface topography on both macroscopic and microscopic scales, combining long scans with fine-area analysis of submicron features. It allows process engineers to quickly compare feature depths and relative surface heights. It also combines the measurement repeatability and ease of use of a Tencor stylus profiler with the high-resolution analysis and imaging capabilities of an Atomic Force Microscope (AFM).Documents
No documents