Description
KLA-Tencor P-10 Surface Profiler Manufacturer: KLA-Tencor Model: P-10 Equipment Type: Surface Profiler Measurement Method: Contact Stylus Maximum Wafer Size: 8 inch (200 mm) Measurement Capabilities: Step Height, Surface Roughness, Waviness Vertical Measurement Range: Up to approximately 300 µm (configuration dependent) Vertical Resolution: 0.5 / 2 / 10 Å (depending on configuration) Scan Length: 60 mm standard; up to 150 mm on some configurations Scan Speed: 1 µm/s to 25 mm/s Stylus Tip: Diamond, 2 µm radius (configuration dependent) Stage: Motorized XY Stage The KLA-Tencor P-10 is a contact stylus surface profiler designed for measuring step height, surface roughness, and waviness on semiconductor wafers and other materials. Specifications depend on the installed measurement head and configuration.Configuration
No ConfigurationOEM Model Description
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.Documents
No documents
Similar Listings
View All
KLA
P-10
CATEGORY
Profiler
Last Verified: 8 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
153632
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
KLA-Tencor P-10 Surface Profiler Manufacturer: KLA-Tencor Model: P-10 Equipment Type: Surface Profiler Measurement Method: Contact Stylus Maximum Wafer Size: 8 inch (200 mm) Measurement Capabilities: Step Height, Surface Roughness, Waviness Vertical Measurement Range: Up to approximately 300 µm (configuration dependent) Vertical Resolution: 0.5 / 2 / 10 Å (depending on configuration) Scan Length: 60 mm standard; up to 150 mm on some configurations Scan Speed: 1 µm/s to 25 mm/s Stylus Tip: Diamond, 2 µm radius (configuration dependent) Stage: Motorized XY Stage The KLA-Tencor P-10 is a contact stylus surface profiler designed for measuring step height, surface roughness, and waviness on semiconductor wafers and other materials. Specifications depend on the installed measurement head and configuration.Configuration
No ConfigurationOEM Model Description
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.Documents
No documents