Description
Used tool Can DEMOConfiguration
No ConfigurationOEM Model Description
The AlphaStep® D-120 Stylus Profiler is a surface profilometry system designed for engineering and research. It has a 55mm scan length, a Z sensor range up to 1.2mm, and a 200mm motorized sample positioning stage. It offers sub-angstrom resolution, 6 angstrom step height repeatability, and motorized X-Y stages. The system is compatible with Windows XP, Vista, and Windows 7. Its graphical user interface allows for continuous acquisition and display of scan data. Applications include surface texture, precision step height, surface form, thin film stress, biological, MEMS, 3D imaging, and material characterization.Documents
No documents
KLA
ALPHA-STEP D-120
Verified
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
61492
Wafer Sizes:
Unknown
Vintage:
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
ALPHA-STEP D-120
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
61492
Wafer Sizes:
Unknown
Vintage:
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Used tool Can DEMOConfiguration
No ConfigurationOEM Model Description
The AlphaStep® D-120 Stylus Profiler is a surface profilometry system designed for engineering and research. It has a 55mm scan length, a Z sensor range up to 1.2mm, and a 200mm motorized sample positioning stage. It offers sub-angstrom resolution, 6 angstrom step height repeatability, and motorized X-Y stages. The system is compatible with Windows XP, Vista, and Windows 7. Its graphical user interface allows for continuous acquisition and display of scan data. Applications include surface texture, precision step height, surface form, thin film stress, biological, MEMS, 3D imaging, and material characterization.Documents
No documents