Description
FEATURES AND BENEFITS - Application flexibility for failure analysis, design and verification, parametric and functional tests - Precision and stability for submicron probing - Accommodates packaged parts and single chips as well as wafers and substrates - Configurations for measuring from attoAmpere level DC to 220 GHz high frequency - Low noise and frost-free measurements from –65°C to 400°C with the SUSS ProbeShield® - Interfaces to leading analysis instrumentation, optics, software and testers - ProberBench operating system, fully operable with or without a PC To Include: (1) Thermochuck 6inConfiguration
- Karl Suss Joystick Controller & Power Supply, - Motorized Mitutoyo Microscope with Mitutoyo Objectives & Eye Piece - Motorized Chuck Platform - Optem Fiber & Illuminator, - Basler Scout IR Camera - Anti-vibration table - Karl Suss Manual High Frequency Probe Head & Arm (PH250HF) - 3units - Probe arm and probe head - 3units - XYZ Edmund Optic Micro Positioners- 1 unitOEM Model Description
The SUSS PA200 Semiautomatic Probe System is available as two versions, one for high speed (HS) and one for high resolution (HR) applications. They are both very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8).Documents
No documents
SUSS MicroTec / KARL SUSS
PA200
Verified
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
64434
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View All
SUSS MicroTec / KARL SUSS
PA200
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
64434
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
FEATURES AND BENEFITS - Application flexibility for failure analysis, design and verification, parametric and functional tests - Precision and stability for submicron probing - Accommodates packaged parts and single chips as well as wafers and substrates - Configurations for measuring from attoAmpere level DC to 220 GHz high frequency - Low noise and frost-free measurements from –65°C to 400°C with the SUSS ProbeShield® - Interfaces to leading analysis instrumentation, optics, software and testers - ProberBench operating system, fully operable with or without a PC To Include: (1) Thermochuck 6inConfiguration
- Karl Suss Joystick Controller & Power Supply, - Motorized Mitutoyo Microscope with Mitutoyo Objectives & Eye Piece - Motorized Chuck Platform - Optem Fiber & Illuminator, - Basler Scout IR Camera - Anti-vibration table - Karl Suss Manual High Frequency Probe Head & Arm (PH250HF) - 3units - Probe arm and probe head - 3units - XYZ Edmund Optic Micro Positioners- 1 unitOEM Model Description
The SUSS PA200 Semiautomatic Probe System is available as two versions, one for high speed (HS) and one for high resolution (HR) applications. They are both very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8).Documents
No documents