Description
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-Thin Wafer Probe -FUCTIONAL -Voltage:230 VOLTS -Frequency:50 HERTZ -Phase: 1 -Current: 10 AMPS -Dimensions: Standard -Overall: 60 x 48 x 30 IN - 800 LBSOEM Model Description
This product line is positioned to satisfy high volume semiconductor manufacturing applications. The Horizon 4000 Series provides many advanced automation capabilities including automatic probe-to-pad-alignment, in-process inspection and optical character recognition (OCR). Optional for Horizon Series probers is a temperature controlled chuck top, providing the ability to maintain precisely a customer-selected wafer temperature during testing. The Horizon 4090, and Horizon 4090u micro utilize the Company's EGCommander system software. The 4090u prober also offers an integrated mini-environment and clean air system to provide a class 1 probing environment.Documents
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MARTEK / ELECTROGLAS (EG)
HORIZON 4090µ
Verified
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
53728
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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MARTEK / ELECTROGLAS (EG)
HORIZON 4090µ
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
53728
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
-Thin Wafer Probe -FUCTIONAL -Voltage:230 VOLTS -Frequency:50 HERTZ -Phase: 1 -Current: 10 AMPS -Dimensions: Standard -Overall: 60 x 48 x 30 IN - 800 LBSOEM Model Description
This product line is positioned to satisfy high volume semiconductor manufacturing applications. The Horizon 4000 Series provides many advanced automation capabilities including automatic probe-to-pad-alignment, in-process inspection and optical character recognition (OCR). Optional for Horizon Series probers is a temperature controlled chuck top, providing the ability to maintain precisely a customer-selected wafer temperature during testing. The Horizon 4090, and Horizon 4090u micro utilize the Company's EGCommander system software. The 4090u prober also offers an integrated mini-environment and clean air system to provide a class 1 probing environment.Documents
No documents