Description

8” wafer handling system Hot chuck Z-stage Dual camera alignment system (DPS) EG Commander control PC Tester interface (GPIB/RS232/TTL).

Configuration

No Configuration

OEM Model Description

This product line is positioned to satisfy high volume semiconductor manufacturing applications. The Horizon 4000 Series provides many advanced automation capabilities including automatic probe-to-pad-alignment, in-process inspection and optical character recognition (OCR). Optional for Horizon Series probers is a temperature controlled chuck top, providing the ability to maintain precisely a customer-selected wafer temperature during testing. The Horizon 4090, and Horizon 4090u micro utilize the Company's EGCommander system software. The 4090u prober also offers an integrated mini-environment and clean air system to provide a class 1 probing environment.

Documents

No documents

MARTEK / ELECTROGLAS (EG)

HORIZON 4090µ

Verified

Probers

Last Verified: 7 days ago

Key Item Details

Condition:

Used

Operational Status:

Unknown

Product ID:

146740

Wafer Sizes:

8"/200mm

Vintage:

Unknown

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

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