The PrecisionPoint™ VX3 System is the latest addition to the PrecisionPoint™ VX platform, which has been the industry standard for dependable test, analysis, and rework of probe cards. The VX3 is designed to meet the testing needs of today’s fine-pitch, small array probe cards, including logic and LCD drivers. It offers a wide range of features to ensure accurate and efficient testing, including support for a variety of checkplates, a patented QuickFlip feature for easy and accurate test-to-rework positioning, and proprietary image processing recipes for enhanced testing of most probe tip geometries. The system is optimized for arrays 4 inches or smaller and offers channel configuration options from 375 to 4500 to meet your specific testing needs. With the PrecisionPoint™ VX3 System, you can be confident in your ability to test for planarity, alignment, Cres, leakage, probe force, and more.

ONTO / RUDOLPH / APPLIED PRECISION

PrecisionPoint VX3

PROBEWORX 300

Point VX2 Extension

The PrecisionWoRx VX4 series is a cutting-edge probe test platform designed to provide accurate and repeatable performance. Based on the industry-standard PrecisionPoint, the PrecisionWoRx platform allows users to confidently test tighter pitches and smaller probe tips. It supports a wide variety of checkplates to suit your process and technology requirements, and its patented QuickFlip feature makes the test-to-rework positioning of the probe card easy and accurate. The platform is optimized for arrays 4 inches or smaller and features proprietary image processing recipes for enhanced testing of the majority of probe tip geometries in use today. With measure channel configuration options from 375 to 2250, the PrecisionWoRx VX4 series is suited to meet your testing needs, supporting probe cards with needle counts up to 35,000. Overall, the PrecisionWoRx VX4 series is a reliable and versatile solution for today’s probe test challenges.

PrecisionWoRx VX4

The WaferWoRx 300® is a powerful tool that analyzes the probe mark to reveal the true performance of the prober, probe card, and setup under actual test conditions. It replaces time-consuming manual analysis with automated probe mark data collection and analysis, delivering quantifiable data and easy-to-interpret results in minimal time. This enables you to rapidly assess your probing process, identify and analyze issues within the process, and define solution options. The WaferWoRx 300 features high-resolution 3D and 2D probe mark and probe tip inspection, proprietary WaferWoRx software for prober setup and performance analysis, Test-at-Temperature probing analysis for true test cell performance, and advanced algorithms and image-based analysis for rapid screening of probed wafers. Overall, the WaferWoRx 300 is a powerful tool that can help you increase control over your probing process and improve its performance.

ONTO / RUDOLPH / APPLIED PRECISION

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