Description
No descriptionConfiguration
Hinge Manipulator: Yes Type of tester head plate: Agilent Prober power supply rate: 230V Chuck Type (Nickel, Gold, etc.): Gold, Karo Pattern, Stagepin mit Bernoulli Network/connection: Yes APCC Auto Probe Card Changer: No Top Side Handling: No Cleaning pad module: Yes/ Tungsten Chiller/ Cold Option: No Hot Option (25-180°C): YesOEM Model Description
The ACCRETECH / TSK UF200A is a probing machine used for wafer and CSP handling. It is a highly efficient, high throughput machine that offers better cost performance. It can perform transfer and testing on 5 to 8 inch wafers and has a variety of options for all kinds of wafer tests.Documents
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ACCRETECH / TSK
UF200A
Verified
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
101936
Wafer Sizes:
Unknown
Vintage:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ACCRETECH / TSK
UF200A
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
101936
Wafer Sizes:
Unknown
Vintage:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Hinge Manipulator: Yes Type of tester head plate: Agilent Prober power supply rate: 230V Chuck Type (Nickel, Gold, etc.): Gold, Karo Pattern, Stagepin mit Bernoulli Network/connection: Yes APCC Auto Probe Card Changer: No Top Side Handling: No Cleaning pad module: Yes/ Tungsten Chiller/ Cold Option: No Hot Option (25-180°C): YesOEM Model Description
The ACCRETECH / TSK UF200A is a probing machine used for wafer and CSP handling. It is a highly efficient, high throughput machine that offers better cost performance. It can perform transfer and testing on 5 to 8 inch wafers and has a variety of options for all kinds of wafer tests.Documents
No documents