Description
No descriptionConfiguration
-Docking Type (Not Including Docking Interface): ND2 -OS: S7.39.FC -Hinge: MHF4000S -Auto Card Change: Yes Stage unit -Chuck: Nickel Chuck -Temp contr: Hot Chuck -Chuck Temp: 30℃～150℃ Cleaning unit: Yes Others -Tester I/F: GPIB -OCR: O -Inker: O -Ethernet: OOEM Model Description
The ACCRETECH / TSK UF2000 is a probing machine for 200mm wafers. It is a high precision, high rigidity machine that offers a variety of options for wafer test. Some of the options include testing environments that can adopt from ultrahigh to low temperature, transfer of warpage and ultrathin wafer by the special transfer mechanism, and a low noise testing environment.Documents
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ACCRETECH / TSK
UF2000
Verified
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
100906
Wafer Sizes:
Unknown
Vintage:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ACCRETECH / TSK
UF2000
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
100906
Wafer Sizes:
Unknown
Vintage:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
-Docking Type (Not Including Docking Interface): ND2 -OS: S7.39.FC -Hinge: MHF4000S -Auto Card Change: Yes Stage unit -Chuck: Nickel Chuck -Temp contr: Hot Chuck -Chuck Temp: 30℃～150℃ Cleaning unit: Yes Others -Tester I/F: GPIB -OCR: O -Inker: O -Ethernet: OOEM Model Description
The ACCRETECH / TSK UF2000 is a probing machine for 200mm wafers. It is a high precision, high rigidity machine that offers a variety of options for wafer test. Some of the options include testing environments that can adopt from ultrahigh to low temperature, transfer of warpage and ultrathin wafer by the special transfer mechanism, and a low noise testing environment.Documents
No documents