Description
Test HandlerConfiguration
No ConfigurationOEM Model Description
Flexible Test and Scan Solution for FFC Devices. 32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for wafer-level chip scale and bare dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity. A complete finishing solution with full vision inspection, test contacting, with up to 12″ Wafer Input with 180° Flip-Chip under Turret.Documents
No documents
Verified
CATEGORY
Packaging
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
135634
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
COHU / ISMECA
NY32W
CATEGORY
Packaging
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
135634
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Test HandlerConfiguration
No ConfigurationOEM Model Description
Flexible Test and Scan Solution for FFC Devices. 32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for wafer-level chip scale and bare dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity. A complete finishing solution with full vision inspection, test contacting, with up to 12″ Wafer Input with 180° Flip-Chip under Turret.Documents
No documents