Skip to main content
Moov logo
Moov Icon
COHU / ISMECA NY32W
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Flexible Test and Scan Solution for FFC Devices. 32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for wafer-level chip scale and bare dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity. A complete finishing solution with full vision inspection, test contacting, with up to 12″ Wafer Input with 180° Flip-Chip under Turret.
    Documents

    No documents

    COHU / ISMECA

    NY32W

    verified-listing-icon

    Verified

    CATEGORY
    Packaging

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    120882

    Wafer Sizes:

    Unknown

    Vintage:

    2016

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    COHU / ISMECA NY32W

    COHU / ISMECA

    NY32W

    Packaging
    Vintage: 2016Condition: Used
    Last VerifiedOver 60 days ago
    COHU / ISMECA NY32W

    COHU / ISMECA

    NY32W

    Packaging
    Vintage: 0Condition: Used
    Last VerifiedOver 30 days ago

    COHU / ISMECA

    NY32W

    verified-listing-icon
    Verified
    CATEGORY
    Packaging
    Last Verified: Over 60 days ago
    listing-photo-a631414399844e2ebb0fe43dcb46be53-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/a631414399844e2ebb0fe43dcb46be53/6583918ba27f4dac824697a5f7a10103_beb5ba5441124221b0d50916f2979dc145005c_mw.jpeg
    listing-photo-a631414399844e2ebb0fe43dcb46be53-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/a631414399844e2ebb0fe43dcb46be53/336c6763f89b4a0990c4698c00b0c654_daf4243ac33648e08013efa55263833d45005c_mw.jpeg
    listing-photo-a631414399844e2ebb0fe43dcb46be53-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/a631414399844e2ebb0fe43dcb46be53/72e4b8089b904333b23ac8954fba0541_ce4986914fec449a8773d8bbbdd653b545005c_mw.jpeg
    listing-photo-a631414399844e2ebb0fe43dcb46be53-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/a631414399844e2ebb0fe43dcb46be53/94dbfeaab68640af9621c8c0b810b18a_5add942b6a5d4a84817a51830310d16045005c_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    120882

    Wafer Sizes:

    Unknown

    Vintage:

    2016

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Flexible Test and Scan Solution for FFC Devices. 32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for wafer-level chip scale and bare dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity. A complete finishing solution with full vision inspection, test contacting, with up to 12″ Wafer Input with 180° Flip-Chip under Turret.
    Documents

    No documents

    Similar Listings
    View All
    COHU / ISMECA NY32W

    COHU / ISMECA

    NY32W

    PackagingVintage: 2016Condition: UsedLast Verified:Over 60 days ago
    COHU / ISMECA NY32W

    COHU / ISMECA

    NY32W

    PackagingVintage: 0Condition: UsedLast Verified:Over 30 days ago