
Description
No descriptionConfiguration
- 20nm TSV Placeholder (Eval)OEM Model Description
The UniFire 7900 optical metrology system provides high precision, three-dimensional topography information to control high volume manufacturing processes. The UniFire 7900 is used for surface topography, critical dimensions, overlay/registration, and film thickness process control all within a small footprint.Documents
No documents
Verified
CATEGORY
Overlay
Last Verified: 29 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
136827
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZYGO
UNIFIRE 7900
CATEGORY
Overlay
Last Verified: 29 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
136827
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
- 20nm TSV Placeholder (Eval)OEM Model Description
The UniFire 7900 optical metrology system provides high precision, three-dimensional topography information to control high volume manufacturing processes. The UniFire 7900 is used for surface topography, critical dimensions, overlay/registration, and film thickness process control all within a small footprint.Documents
No documents