Description
Option: Lumenera Infinity 2-3C, 3.3 megapixel Digital CCD Camera with PC and softwareConfiguration
300mm reflected light microscope 12x12 xy stage with coaxial controls  (Can accept XY stage up to 24"x24") configured for brightfield and darkfield inspection front mounted controls for light intensity 3 position cube slider for BF/DF/optional DIC Integrated motorized aperture stop RS-232C interface for PC data export MX-SWETTR Ultrawidefield tilting observation head super widefield SWH10x-H/26.5 eyepieces 5x/0.15 UM Plan BD objective 10x/0.30 UM Plan BD objective 20x/0.40 LM Plan BD objective 50x//0.50 LM Plan BD objective 100x/0.80 LM Plan BD objective Motorized nosepiece rotation U-25ND25 filterOEM Model Description
The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.Documents
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OLYMPUS
MX61L
Verified
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
24292
Wafer Sizes:
12"/300mm
Vintage:
Unknown
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OLYMPUS
MX61L
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
24292
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Option: Lumenera Infinity 2-3C, 3.3 megapixel Digital CCD Camera with PC and softwareConfiguration
300mm reflected light microscope 12x12 xy stage with coaxial controls  (Can accept XY stage up to 24"x24") configured for brightfield and darkfield inspection front mounted controls for light intensity 3 position cube slider for BF/DF/optional DIC Integrated motorized aperture stop RS-232C interface for PC data export MX-SWETTR Ultrawidefield tilting observation head super widefield SWH10x-H/26.5 eyepieces 5x/0.15 UM Plan BD objective 10x/0.30 UM Plan BD objective 20x/0.40 LM Plan BD objective 50x//0.50 LM Plan BD objective 100x/0.80 LM Plan BD objective Motorized nosepiece rotation U-25ND25 filterOEM Model Description
The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.Documents
No documents