Description
Olympus MX50 metallographic microscope 1. Eyepiece: SWN 10X/222. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source lamp house 5. Objective lens: BD 5X, BD10X, BD20X, BD50X6. CCD adapter mirror 7. Mobile bed: 8X8 STAGEConfiguration
No ConfigurationOEM Model Description
The Olympus MX50 is a microscope designed for inspecting semiconductors and wafers. It is user-friendly and allows for comfortable operation during extended periods of use. The microscope offers a variety of observation methods, including brightfield, darkfield, differential interference contrast (DIC), and polarized light. Additionally, it has a motorized objective change feature for quick and easy observation changesDocuments
No documents
OLYMPUS
MX50
Verified
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
108128
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View All
OLYMPUS
MX50
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
108128
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Olympus MX50 metallographic microscope 1. Eyepiece: SWN 10X/222. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source lamp house 5. Objective lens: BD 5X, BD10X, BD20X, BD50X6. CCD adapter mirror 7. Mobile bed: 8X8 STAGEConfiguration
No ConfigurationOEM Model Description
The Olympus MX50 is a microscope designed for inspecting semiconductors and wafers. It is user-friendly and allows for comfortable operation during extended periods of use. The microscope offers a variety of observation methods, including brightfield, darkfield, differential interference contrast (DIC), and polarized light. Additionally, it has a motorized objective change feature for quick and easy observation changesDocuments
No documents