Description
No descriptionConfiguration
1. Eyepiece: SWN 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source light house 5. Backlight light source 6. Objective lens: BD 5X, 10X, 20X, 50X 7. CCD Adapter mirror 8. Mobile bed: 8X8 STAGEOEM Model Description
The Olympus MX50 is a microscope designed for inspecting semiconductors and wafers. It is user-friendly and allows for comfortable operation during extended periods of use. The microscope offers a variety of observation methods, including brightfield, darkfield, differential interference contrast (DIC), and polarized light. Additionally, it has a motorized objective change feature for quick and easy observation changesDocuments
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OLYMPUS
MX50
Verified
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
74544
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
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Transaction Insured by Moov
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Refurbishment Services
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OLYMPUS
MX50
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
74544
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
1. Eyepiece: SWN 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source light house 5. Backlight light source 6. Objective lens: BD 5X, 10X, 20X, 50X 7. CCD Adapter mirror 8. Mobile bed: 8X8 STAGEOEM Model Description
The Olympus MX50 is a microscope designed for inspecting semiconductors and wafers. It is user-friendly and allows for comfortable operation during extended periods of use. The microscope offers a variety of observation methods, including brightfield, darkfield, differential interference contrast (DIC), and polarized light. Additionally, it has a motorized objective change feature for quick and easy observation changesDocuments
No documents