Description
No descriptionConfiguration
1. Eyepiece: SWN 10X 2. Observer barrel: Three-eye observer barrel 3. Nasal ring: 5-hole manual nostril 4. Light house 5. Light and dark field body, object mirror: 5XBD,10XBD ,20XBD , 50XBD , 100BD 6. CCD transfer mirror 7. Mobile bed: 6X6 STAGEOEM Model Description
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.Documents
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NIKON
OPTIPHOT 150
Verified
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
47557
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
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NIKON
OPTIPHOT 150
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
47557
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
1. Eyepiece: SWN 10X 2. Observer barrel: Three-eye observer barrel 3. Nasal ring: 5-hole manual nostril 4. Light house 5. Light and dark field body, object mirror: 5XBD,10XBD ,20XBD , 50XBD , 100BD 6. CCD transfer mirror 7. Mobile bed: 6X6 STAGEOEM Model Description
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.Documents
No documents