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NIKON OPTIPHOT 150
  • NIKON OPTIPHOT 150
  • NIKON OPTIPHOT 150
  • NIKON OPTIPHOT 150
Description
Working
Configuration
No Configuration
OEM Model Description
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.
Documents

No documents

CATEGORY
Microscope

Last Verified: Over 60 days ago

Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

106148


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

NIKON

OPTIPHOT 150

verified-listing-icon
Verified
CATEGORY
Microscope
Last Verified: Over 60 days ago
listing-photo-17084e59fbb64753a8f8c9d3bfa594fa-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

106148


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Working
Configuration
No Configuration
OEM Model Description
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.
Documents

No documents