Description
Nikon Eclipse LV150 materials/metallurgical stereo microscope, Trinocular head with a motorized 5 position nosepiece 5 Nikon objective lenses: 2.5x, 5x, 10x, 20x, 50x A pair of 10x eyepieces Bright-Field (BF), Dark-Field (DF), Differential Interference Contrast (DIC) imaging capability with reflected light using a halogen lamp Fluorescence imaging capability using attached ultraviolet lamp and selectable wavelength filters 6” x 6” stage Digital camera PC with imaging softwareConfiguration
No ConfigurationOEM Model Description
A series of flexible, modular, upright microscopes for various episcopic optical contrast techniques (BF-DF-DIC-POL-Fluorescence-Interferometry). Together with digital imaging accessories and large stage X-Y travels, the instruments are ideal for semiconductor and material inspection activities.Documents
No documents
Verified
CATEGORY
Microscope
Last Verified: 13 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
138236
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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NIKON
ECLIPSE LV150
CATEGORY
Microscope
Last Verified: 13 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
138236
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Nikon Eclipse LV150 materials/metallurgical stereo microscope, Trinocular head with a motorized 5 position nosepiece 5 Nikon objective lenses: 2.5x, 5x, 10x, 20x, 50x A pair of 10x eyepieces Bright-Field (BF), Dark-Field (DF), Differential Interference Contrast (DIC) imaging capability with reflected light using a halogen lamp Fluorescence imaging capability using attached ultraviolet lamp and selectable wavelength filters 6” x 6” stage Digital camera PC with imaging softwareConfiguration
No ConfigurationOEM Model Description
A series of flexible, modular, upright microscopes for various episcopic optical contrast techniques (BF-DF-DIC-POL-Fluorescence-Interferometry). Together with digital imaging accessories and large stage X-Y travels, the instruments are ideal for semiconductor and material inspection activities.Documents
No documents