Description
Metallographic Microscope Ocular 10X BD 5X, 10X, 20X, 50X 6” * 6” stageConfiguration
1. Eyepiece: CFI 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: manual nose wheel 4. Upper light source: 12V-50W light house light source 5. The body has the function of switching between light and dark field of view 6. Objective lens: 5X. 10X. 20X. 50X 7. CCD adapter mirror 8. Moving bed: 6X6 STAGEOEM Model Description
A series of flexible, modular, upright microscopes for various episcopic optical contrast techniques (BF-DF-DIC-POL-Fluorescence-Interferometry). Together with digital imaging accessories and large stage X-Y travels, the instruments are ideal for semiconductor and material inspection activities.Documents
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NIKON
ECLIPSE LV150
Verified
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
74557
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
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Refurbishment Services
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NIKON
ECLIPSE LV150
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
74557
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Metallographic Microscope Ocular 10X BD 5X, 10X, 20X, 50X 6” * 6” stageConfiguration
1. Eyepiece: CFI 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: manual nose wheel 4. Upper light source: 12V-50W light house light source 5. The body has the function of switching between light and dark field of view 6. Objective lens: 5X. 10X. 20X. 50X 7. CCD adapter mirror 8. Moving bed: 6X6 STAGEOEM Model Description
A series of flexible, modular, upright microscopes for various episcopic optical contrast techniques (BF-DF-DIC-POL-Fluorescence-Interferometry). Together with digital imaging accessories and large stage X-Y travels, the instruments are ideal for semiconductor and material inspection activities.Documents
No documents