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HITACHI TM-1000
    Description
    No description
    Configuration
    -Magnification: 20-10,000x -Accelerating Voltage: 15KV -Observation modes: Standard/charge up reduction mode Specimen traverse: X: 15mm, Y: 18mm -Maximum Sample Size: 70mm in diameter -Maximum Sample Thickness: 20mm -Electron Gun: Pre-centered cartridge filament -Detection system: High sensitive semiconductor BSE detector Auto functions: Auto Start, Auto focus, ---Auto brightness -Frame Memory: 640 x 480, 1280 x 960 pixels -Image Format: BMP -Evacuation system: Turbomolecular and diaphragm pumps Windows OS: XP -Power Source: Single phase AC 100, 110, 115, 200, 220 or 240V
    OEM Model Description
    The "TM-1000" allows for stereoscopically morphological observation with high resolution and a greater depth of focus which are not available with an optical microscope. The "TM-1000" uses backscattered electrons (BSE) for image observation.
    Documents

    No documents

    HITACHI

    TM-1000

    verified-listing-icon

    Verified

    CATEGORY

    Microscope
    Last Verified: Over 60 days ago
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    74437


    Wafer Sizes:

    Unknown


    Vintage:

    2006

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    HITACHI TM-1000
    HITACHITM-1000Microscope
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    HITACHI

    TM-1000

    verified-listing-icon

    Verified

    CATEGORY

    Microscope
    Last Verified: Over 60 days ago
    listing-photo-5f3a7666cebe4dc1899736c6341c7a17-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1454/5f3a7666cebe4dc1899736c6341c7a17/44d9bd18fdbf4189b9a88b18d4c35232_screenshot20230512at2_mw.png
    listing-photo-5f3a7666cebe4dc1899736c6341c7a17-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1454/5f3a7666cebe4dc1899736c6341c7a17/ae4cf0adda3247628de90b67d2e2027d_screenshot20230512at2_mw.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    74437


    Wafer Sizes:

    Unknown


    Vintage:

    2006


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    -Magnification: 20-10,000x -Accelerating Voltage: 15KV -Observation modes: Standard/charge up reduction mode Specimen traverse: X: 15mm, Y: 18mm -Maximum Sample Size: 70mm in diameter -Maximum Sample Thickness: 20mm -Electron Gun: Pre-centered cartridge filament -Detection system: High sensitive semiconductor BSE detector Auto functions: Auto Start, Auto focus, ---Auto brightness -Frame Memory: 640 x 480, 1280 x 960 pixels -Image Format: BMP -Evacuation system: Turbomolecular and diaphragm pumps Windows OS: XP -Power Source: Single phase AC 100, 110, 115, 200, 220 or 240V
    OEM Model Description
    The "TM-1000" allows for stereoscopically morphological observation with high resolution and a greater depth of focus which are not available with an optical microscope. The "TM-1000" uses backscattered electrons (BSE) for image observation.
    Documents

    No documents

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