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UNITY SEMICONDUCTOR / HSEB Lightspeed

Description

LightSPEED "Standard" (200mm compliant) Dark Field & Doppler detection capability Sensitivity down to 50nm on Si Transparent and opaque wafers Automated Defect Classification (ADC) Standard result file generation FFU on module Throughput • High Sensitivity Mode : 25 wafers per hour High ThroughtPut Mode: 70 wafers per hour EFEM two Loadports with vacuum handling EFEM two load ports SMIF pod 200mm compliant Light tower 4 colors Wafer ID reader (Backside) FFU on EFEM Integration of RFID reader for SMIF pod TAG (design and material provided by OSRAM) Factory Automation: Including SECS/GEM, compatible with ATV (E84 compliant with exception of PIO sensor

Configuration

Application: Frontside Unpattern inspection 2 GaAs (thickness 675 um) Sapphire (thickness 600-2000 um) Silicon

OEM Model Description

None Provided

Documents

No documents

UNITY SEMICONDUCTOR / HSEB

Lightspeed

verified-listing-icon

Verified

CATEGORY

Metrology

Last Verified: 11 days ago

Key Item Details

Condition:

Used

Operational Status:

Unknown

Product ID:

147462

Wafer Sizes:

8"/200mm

Vintage:

2022

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

Similar Listings

UNITY SEMICONDUCTOR / HSEB Lightspeed

UNITY SEMICONDUCTOR / HSEB

Lightspeed

Vintage: 2022Condition: Used

Last Verified11 days ago

UNITY SEMICONDUCTOR / HSEB

Lightspeed

verified-listing-icon

Verified

CATEGORY

Metrology

Last Verified: 11 days ago

listing-photo-709cf31a8574403ab370a8eca756634e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53362/709cf31a8574403ab370a8eca756634e/ef928308fbb345ce89fc1fce4444eb05_a9cffd34d9cd4206b8ea703cbcc4e4e61201a_mw.jpeg

listing-photo-709cf31a8574403ab370a8eca756634e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53362/709cf31a8574403ab370a8eca756634e/4dd988fafc524034a2adab7be3c52058_e18222af1294435199872a3cf05c46dc1201a_mw.jpeg

listing-photo-709cf31a8574403ab370a8eca756634e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53362/709cf31a8574403ab370a8eca756634e/8063987d516242498a9689a971dedcaa_392a5f80465949f8b55e105444bcc3761201a_mw.jpeg

Key Item Details

Condition:

Used

Operational Status:

Unknown

Product ID:

147462

Wafer Sizes:

8"/200mm

Vintage:

2022

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

Description

LightSPEED "Standard" (200mm compliant) Dark Field & Doppler detection capability Sensitivity down to 50nm on Si Transparent and opaque wafers Automated Defect Classification (ADC) Standard result file generation FFU on module Throughput • High Sensitivity Mode : 25 wafers per hour High ThroughtPut Mode: 70 wafers per hour EFEM two Loadports with vacuum handling EFEM two load ports SMIF pod 200mm compliant Light tower 4 colors Wafer ID reader (Backside) FFU on EFEM Integration of RFID reader for SMIF pod TAG (design and material provided by OSRAM) Factory Automation: Including SECS/GEM, compatible with ATV (E84 compliant with exception of PIO sensor

Configuration

Application: Frontside Unpattern inspection 2 GaAs (thickness 675 um) Sapphire (thickness 600-2000 um) Silicon

OEM Model Description

None Provided

Documents

No documents

Similar Listings

UNITY SEMICONDUCTOR / HSEB Lightspeed

UNITY SEMICONDUCTOR / HSEB

Lightspeed

MetrologyVintage: 2022Condition: UsedLast Verified:11 days ago