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OTSUKA / TEKNOLOGUE FE-3000
    Description
    Film thickness measurement system
    Configuration
    No Configuration
    OEM Model Description
    A film thickness measurement system based on the microscopic spectrophotometry features the availability of non-contact and non-destructive measurements with high accuracy and high reproducibility. These systems are widely used in different fields including the semiconductor, flat panel display and other various electronic optical materials.
    Documents

    No documents

    OTSUKA / TEKNOLOGUE

    FE-3000

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: 10 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    153395

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    OTSUKA / TEKNOLOGUE FE-3000

    OTSUKA / TEKNOLOGUE

    FE-3000

    Metrology
    Vintage: 0Condition: Used
    Last Verified10 days ago

    OTSUKA / TEKNOLOGUE

    FE-3000

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: 10 days ago
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/0c69814006344cd9a0c789e30667be21_1000004579scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/e808658681584ed3b8339f33ca4210ad_1000004582scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/cd6d012f157844fcbd5d2cf697f81a55_1000004581scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/aba72c16a492498da5c2f2ddeb817e3c_1000004583scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/31efc7ebe3694cb9804f25aa59027222_1000004584scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/b17b80fb2e854c7f9c2b6725ee10dcab_1000004586scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/ff6ced9c6dc6424e8868e05199ec41ff_1000004585scrubbed_mw.jpeg
    listing-photo-89cd9aaf8bfc43cfa526d20de927ec79-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73965/89cd9aaf8bfc43cfa526d20de927ec79/2f3791c658154be78a74111a36719a56_1000004578scrubbed_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    153395

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Film thickness measurement system
    Configuration
    No Configuration
    OEM Model Description
    A film thickness measurement system based on the microscopic spectrophotometry features the availability of non-contact and non-destructive measurements with high accuracy and high reproducibility. These systems are widely used in different fields including the semiconductor, flat panel display and other various electronic optical materials.
    Documents

    No documents

    Similar Listings
    View All
    OTSUKA / TEKNOLOGUE FE-3000

    OTSUKA / TEKNOLOGUE

    FE-3000

    MetrologyVintage: 0Condition: UsedLast Verified:10 days ago