Description
Critical Dimension (CD) Measurement (non SEM)Configuration
No ConfigurationOEM Model Description
A wide range of 2D/3D and in-die metrology solutions for Dielectric and Copper CMP, Photolithography, Etch and CVDDocuments
No documents
NOVA
NS3090Next SA
Verified
CATEGORY
Metrology
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
62737
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
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Refurbishment Services
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Similar Listings
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NOVA
NS3090Next SA
CATEGORY
Metrology
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
62737
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Critical Dimension (CD) Measurement (non SEM)Configuration
No ConfigurationOEM Model Description
A wide range of 2D/3D and in-die metrology solutions for Dielectric and Copper CMP, Photolithography, Etch and CVDDocuments
No documents
Similar Listings
View AllNo Similar Listings