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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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NAPSON RG-200PV
    Description
    No description
    Configuration
    Maximum size: 210×210 mm. Semi-automatic measuring instrument of resistivity / sheet resistance by 4 point probe method Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc) New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc) Conductive thin film (Metal, ITO etc) Diffused sample , Silicone thin film(LTPS,etc ) Silicon-related epitaxial materials, Ion-implantation sample
    OEM Model Description
    None Provided
    Documents

    No documents

    NAPSON

    RG-200PV

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    114433

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    NAPSON RG-200PV

    NAPSON

    RG-200PV

    Metrology
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    NAPSON

    RG-200PV

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 60 days ago
    listing-photo-510f164c5cd64bd4b083b9265bfda6ef-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    114433

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    Maximum size: 210×210 mm. Semi-automatic measuring instrument of resistivity / sheet resistance by 4 point probe method Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc) New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc) Conductive thin film (Metal, ITO etc) Diffused sample , Silicone thin film(LTPS,etc ) Silicon-related epitaxial materials, Ion-implantation sample
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    NAPSON RG-200PV

    NAPSON

    RG-200PV

    MetrologyVintage: 0Condition: UsedLast Verified:Over 60 days ago