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KLA QUANTOX XP
    Description
    No description
    Configuration
    (QTX-300)-Surface Charge Measurement
    OEM Model Description
    Quantox XP is an in-line, real-time electrical monitoring and characterization tool that enables advanced gate formation for sub-130 nm devices. It provides better than 95% correlation to device electrical test data and allows non-contact electrical test measurements of key transistor gate parameters. ACTIV technology features highly accurate, comprehensive data on physical and electrical properties of advanced gate dielectric materials. Quantox XP offers a complete gate monitoring solution for today’s advanced gate dielectric processes. It also provides comprehensive films metrology control using optical and electrical topography measurements.
    Documents

    No documents

    KLA

    QUANTOX XP

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    107340

    Wafer Sizes:

    12"/300mm

    Vintage:

    2010

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA QUANTOX XP

    KLA

    QUANTOX XP

    Metrology
    Vintage: 2010Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    QUANTOX XP

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 60 days ago
    listing-photo-879bf8d9e0fc46c0a1a4e93ae0e2ca5e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    107340

    Wafer Sizes:

    12"/300mm

    Vintage:

    2010

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    (QTX-300)-Surface Charge Measurement
    OEM Model Description
    Quantox XP is an in-line, real-time electrical monitoring and characterization tool that enables advanced gate formation for sub-130 nm devices. It provides better than 95% correlation to device electrical test data and allows non-contact electrical test measurements of key transistor gate parameters. ACTIV technology features highly accurate, comprehensive data on physical and electrical properties of advanced gate dielectric materials. Quantox XP offers a complete gate monitoring solution for today’s advanced gate dielectric processes. It also provides comprehensive films metrology control using optical and electrical topography measurements.
    Documents

    No documents

    Similar Listings
    View All
    KLA QUANTOX XP

    KLA

    QUANTOX XP

    MetrologyVintage: 2010Condition: UsedLast Verified:Over 60 days ago