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KLA / THERMA-WAVE OP-3290
    Description
    Therma-Wave OP-3960 Opti-Probe CMP Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The Opti-Probe 3290 is a thin film measurement system that uses Beam Profile Reflectrometry (BPR) for thick dielectric films greater than 500A and Beam Profile Ellipsometry (BPE) for thin dielectric films less than 500A. It has a thermo electrically cooled diode laser with a wavelength of 675 nm and a tungsten halogen lamp for spectrometry mode with a range of 450 to 840 nm. The system can measure film thickness, index of refraction, extinction coefficient, and reflectivity for multiple layers and multiple parameters. It also provides automated defect review, enabling rapid correction of defects for improved quality.
    Documents

    No documents

    KLA / THERMA-WAVE

    OP-3290

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: 29 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    93167

    Wafer Sizes:

    Unknown

    Vintage:

    2000

    Have Additional Questions?
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    Money Back Guarantee
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    Transaction Insured by Moov
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    KLA / THERMA-WAVE OP-3290
    KLA / THERMA-WAVEOP-3290Metrology
    Vintage: 0Condition: Used
    Last Verified25 days ago

    KLA / THERMA-WAVE

    OP-3290

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: 29 days ago
    listing-photo-b184edd623fc4f2093b4719facec0a78-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/b184edd623fc4f2093b4719facec0a78/176ec065c1e544f9bcba265dc1aaf4cb_096faf12eb114b76b89b738a2a5059461201a_mw.jpeg
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    listing-photo-b184edd623fc4f2093b4719facec0a78-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/b184edd623fc4f2093b4719facec0a78/caf0f3c8e1ab46b89e662229890c1ff1_6bc40797d3634c3d9d429fb476304ab81201a_mw.jpeg
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    listing-photo-b184edd623fc4f2093b4719facec0a78-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/b184edd623fc4f2093b4719facec0a78/f3dbd7353a93459282ee039028a7d875_c71f9d85ab214946bffceda47d1e386b1201a_mw.jpeg
    listing-photo-b184edd623fc4f2093b4719facec0a78-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/b184edd623fc4f2093b4719facec0a78/4670b0b84e0448d8aa42ce24fe6886c7_3937056fdff347528ba9d3098fefc1ea1201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    93167

    Wafer Sizes:

    Unknown

    Vintage:

    2000

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Therma-Wave OP-3960 Opti-Probe CMP Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The Opti-Probe 3290 is a thin film measurement system that uses Beam Profile Reflectrometry (BPR) for thick dielectric films greater than 500A and Beam Profile Ellipsometry (BPE) for thin dielectric films less than 500A. It has a thermo electrically cooled diode laser with a wavelength of 675 nm and a tungsten halogen lamp for spectrometry mode with a range of 450 to 840 nm. The system can measure film thickness, index of refraction, extinction coefficient, and reflectivity for multiple layers and multiple parameters. It also provides automated defect review, enabling rapid correction of defects for improved quality.
    Documents

    No documents

    Similar Listings
    View All
    KLA / THERMA-WAVE OP-3290
    KLA / THERMA-WAVE
    OP-3290
    MetrologyVintage: 0Condition: UsedLast Verified: 25 days ago