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KLA / MICROSENSE PKMRAM
    Description
    No description
    Configuration
    -300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5T
    OEM Model Description
    The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.
    Documents

    No documents

    KLA / MICROSENSE

    PKMRAM

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    106397

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA / MICROSENSE PKMRAM

    KLA / MICROSENSE

    PKMRAM

    Metrology
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    KLA / MICROSENSE

    PKMRAM

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 60 days ago
    listing-photo-cbaa1412ab664847bc77eebe5e02ec2e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74441/cbaa1412ab664847bc77eebe5e02ec2e/ef3d4aafdfaf429fa352f9e8924be866_3bcd85c864c249a3b303c72539ef73341201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    106397

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    -300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5T
    OEM Model Description
    The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.
    Documents

    No documents

    Similar Listings
    View All
    KLA / MICROSENSE PKMRAM

    KLA / MICROSENSE

    PKMRAM

    MetrologyVintage: 0Condition: UsedLast Verified:Over 60 days ago