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KLA / MICROSENSE PKMRAM
  • KLA / MICROSENSE PKMRAM
Description
No description
Configuration
-300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5T
OEM Model Description
The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.
Documents

No documents

KLA / MICROSENSE

PKMRAM

verified-listing-icon

Verified

CATEGORY
Metrology

Last Verified: Over 60 days ago

Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

106397


Wafer Sizes:

12"/300mm


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA / MICROSENSE

PKMRAM

verified-listing-icon
Verified
CATEGORY
Metrology
Last Verified: Over 60 days ago
listing-photo-cbaa1412ab664847bc77eebe5e02ec2e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74441/cbaa1412ab664847bc77eebe5e02ec2e/ef3d4aafdfaf429fa352f9e8924be866_3bcd85c864c249a3b303c72539ef73341201a_mw.jpeg
Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

106397


Wafer Sizes:

12"/300mm


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No description
Configuration
-300mm Ready Non-Contact Magnetic Property Metrology System for MRAM - 2 Axis 2.5T
OEM Model Description
The MicroSense® PKMRAM system utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize multi-layer wafers’ magnetic properties used to develop and manufacture perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of the magnetic properties of entire wafers up to 300mm. The system is available in both manual loading or fully-automated configurations to meet R&D and/or production requirements.
Documents

No documents