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FRT MicroProf 200 TTV
    Description
    No description
    Configuration
    FRT MPR200 TTV MHU 4 Film Thickness measurement system -Vacuum wafer chuck for 150mm and 200mm wafer -CWL spectrometer 4kHz -CWL 600µm sensor -CWL FT (10µm) sensor head -MHU (wafer handing unit) for 150mm and 200mm Semi standard wafer -Prealigner -Acquire Automation XT software packages: Film thickness; Step height; -Bumps measurement (height, coplanarity, diameter); Roughness;
    OEM Model Description
    automated Non Contact Wafer Metrology Tool
    Documents

    No documents

    FRT

    MicroProf 200 TTV

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    114081


    Wafer Sizes:

    6"/150mm, 8"/200mm


    Vintage:

    2011


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    FRT MicroProf 200 TTV

    FRT

    MicroProf 200 TTV

    Metrology
    Vintage: 2011Condition: Used
    Last VerifiedOver 30 days ago

    FRT

    MicroProf 200 TTV

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 30 days ago
    listing-photo-627654d2b63d4eef92bd1436f4b5dff0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/627654d2b63d4eef92bd1436f4b5dff0/d0e3ed581eb14393be301b584b2528d1_375c88d922d040528ebab695cbea2497_mw.png
    listing-photo-627654d2b63d4eef92bd1436f4b5dff0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/627654d2b63d4eef92bd1436f4b5dff0/61164aa1260b43bab4913b890ed5fdf0_2a23f5f8de09414da7a9f6bbaf7435c7_mw.png
    listing-photo-627654d2b63d4eef92bd1436f4b5dff0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/627654d2b63d4eef92bd1436f4b5dff0/b3c15e5f4079436cae28434edb323924_9a9e8b29b84f426d806412fae4dc4ceb45005c_mw.jpeg
    listing-photo-627654d2b63d4eef92bd1436f4b5dff0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/627654d2b63d4eef92bd1436f4b5dff0/50b714cdf1b34b4a8f35fba9dd7c3b2d_5ac00b9fffe14d2eb900d34201d5e80b_mw.png
    listing-photo-627654d2b63d4eef92bd1436f4b5dff0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/627654d2b63d4eef92bd1436f4b5dff0/d51327c64d5749ae98bb347cf626d237_6d39c65721f34d84bbc155e5d165aa50_mw.png
    listing-photo-627654d2b63d4eef92bd1436f4b5dff0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/627654d2b63d4eef92bd1436f4b5dff0/fb6e9eba06a54d24b9bb0cd15479a9d2_f7402e863cc2447a8b583014c8a6ed64_mw.png
    listing-photo-627654d2b63d4eef92bd1436f4b5dff0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/627654d2b63d4eef92bd1436f4b5dff0/ddeaff68afc7487b8d94951672529119_fa0ea423638e465d9b008d6bc1b8b360_mw.png
    listing-photo-627654d2b63d4eef92bd1436f4b5dff0-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/627654d2b63d4eef92bd1436f4b5dff0/76a9dd29ea4247a0bfc21896b12f0a00_a83f1608556f4a63a033e78ef6600b421201a_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    114081


    Wafer Sizes:

    6"/150mm, 8"/200mm


    Vintage:

    2011


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    FRT MPR200 TTV MHU 4 Film Thickness measurement system -Vacuum wafer chuck for 150mm and 200mm wafer -CWL spectrometer 4kHz -CWL 600µm sensor -CWL FT (10µm) sensor head -MHU (wafer handing unit) for 150mm and 200mm Semi standard wafer -Prealigner -Acquire Automation XT software packages: Film thickness; Step height; -Bumps measurement (height, coplanarity, diameter); Roughness;
    OEM Model Description
    automated Non Contact Wafer Metrology Tool
    Documents

    No documents

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    View All
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