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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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ONTO / NANOMETRICS / ACCENT / BIO-RAD TRAJECTORY T3
    Description
    Film Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The Trajectory T³ is a cutting-edge metrology module developed by Nanometrics for monitoring and controlling critical processes in semiconductor fabs worldwide. It has been approved for integration by leading process tool manufacturers and has set new standards for speed, reliability, and cost. With its robust large area optical collectors, simple yet powerful spectral detectors, and a MTBF of over 10,000 hours, the Trajectory T³ minimizes cost while maximizing performance. Capable of processing over 250 wafers per hour, it can measure every process wafer even on the fastest process tools. By enabling process tools to measure thicknesses inside the tool and inside the wafer’s patterned devices, the Trajectory T³ delivers unparalleled advantages in speed, reliability, and cost. It is truly changing the game in integrated metrology.
    Documents

    No documents

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: 16 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    83162


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ONTO / NANOMETRICS / ACCENT / BIO-RAD TRAJECTORY T3

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    Metrology
    Vintage: 0Condition: Used
    Last Verified16 days ago

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: 16 days ago
    listing-photo-0b3875034164430c91275754a78753c6-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    83162


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Film Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The Trajectory T³ is a cutting-edge metrology module developed by Nanometrics for monitoring and controlling critical processes in semiconductor fabs worldwide. It has been approved for integration by leading process tool manufacturers and has set new standards for speed, reliability, and cost. With its robust large area optical collectors, simple yet powerful spectral detectors, and a MTBF of over 10,000 hours, the Trajectory T³ minimizes cost while maximizing performance. Capable of processing over 250 wafers per hour, it can measure every process wafer even on the fastest process tools. By enabling process tools to measure thicknesses inside the tool and inside the wafer’s patterned devices, the Trajectory T³ delivers unparalleled advantages in speed, reliability, and cost. It is truly changing the game in integrated metrology.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / NANOMETRICS / ACCENT / BIO-RAD TRAJECTORY T3

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    MetrologyVintage: 0Condition: UsedLast Verified:16 days ago