Description
Epi Metrology & TestersConfiguration
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 488nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEM Model Description
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.Documents
No documents
CATEGORY
Metrology
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
134571
Wafer Sizes:
6"/150mm
Vintage:
2018
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
IMPERIA
CATEGORY
Metrology
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
134571
Wafer Sizes:
6"/150mm
Vintage:
2018
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Epi Metrology & TestersConfiguration
Software Version: Carmel Version 2015.3.8300 / Lynx Version 2.15.3.8300 Lasers: 355nm and 488nm Process: Photoluminescence on InGaN or AlInGaP LED wafers Spare Parts: Potentially some available PL SystemOEM Model Description
Imperia is a photoluminescence (“PL”) full wafer imaging and mapping system designed for high-volume compound semiconductor metrology applications including power control and photonics applications adding significant inspection and substrate metrology capability to the established PL fleet.Documents
No documents