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ONTO / NANOMETRICS / ACCENT / BIO-RAD FLX
    Description
    Film Thickness Measurement
    Configuration
    No Configuration
    OEM Model Description
    The Nanometrics FLX is a flexible metrology system that offers cost-efficiency and high throughput for 300 mm standalone metrology. It is based on Nanometrics’ proven integrated metrology solutions and can support up to four integrated metrology modules simultaneously. The tool can mix-and-match any combination of modules to form a complete metrology solution for lithography, CMP, etch, and CVD/deposition processes. This capability accelerates process development through parallel development of integrated metrology solutions. The system offers industry-leading throughput of 250-500 wafers fueled by dual multi-axis wafer-handling robots.
    Documents

    No documents

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    FLX

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: 25 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    151434

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ONTO / NANOMETRICS / ACCENT / BIO-RAD FLX

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    FLX

    Metrology
    Vintage: 0Condition: Used
    Last Verified25 days ago

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    FLX

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: 25 days ago
    listing-photo-ede472e88e0741688046579d277986ce-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    151434

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Film Thickness Measurement
    Configuration
    No Configuration
    OEM Model Description
    The Nanometrics FLX is a flexible metrology system that offers cost-efficiency and high throughput for 300 mm standalone metrology. It is based on Nanometrics’ proven integrated metrology solutions and can support up to four integrated metrology modules simultaneously. The tool can mix-and-match any combination of modules to form a complete metrology solution for lithography, CMP, etch, and CVD/deposition processes. This capability accelerates process development through parallel development of integrated metrology solutions. The system offers industry-leading throughput of 250-500 wafers fueled by dual multi-axis wafer-handling robots.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / NANOMETRICS / ACCENT / BIO-RAD FLX

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    FLX

    MetrologyVintage: 0Condition: UsedLast Verified:25 days ago