Description
No descriptionConfiguration
・Light source; argon-ion laser (λ = 488 nm, and 20 mW) detection method; scattered light detection method; spiral scanning method maximum detection sensitivity (practical measurable particle size); 0.100 μm dynamic range; 0.100 to 5.153 μm (calibrated with standard particles) detection reproducibility; (σn/X) × 100 with 1% or less cleanliness of equipment; 0.5 or less with a total number of counts of 0.100 μm or moreOEM Model Description
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TAKANO / TOPCON
WM-1500
Verified
CATEGORY
Mask Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
26025
Wafer Sizes:
6"/150mm, 8"/200mm
Vintage:
1997
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TAKANO / TOPCON
WM-1500
CATEGORY
Mask Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
26025
Wafer Sizes:
6"/150mm, 8"/200mm
Vintage:
1997
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
・Light source; argon-ion laser (λ = 488 nm, and 20 mW) detection method; scattered light detection method; spiral scanning method maximum detection sensitivity (practical measurable particle size); 0.100 μm dynamic range; 0.100 to 5.153 μm (calibrated with standard particles) detection reproducibility; (σn/X) × 100 with 1% or less cleanliness of equipment; 0.5 or less with a total number of counts of 0.100 μm or moreOEM Model Description
None ProvidedDocuments
No documents